The project is aimed at studying the electrical properties of thin-film planar Fe/MgO/Fe systems depending on the thickness of the dielectric and the contact area. A comprehensive study is planned, in the framework of which a technique will be created and tested that will allow recording the volt-ampere characteristics of thin-film systems under the action of external loads. To do this, the device for kinetic indentation UPM-11 will be modified so that the load is applied to a pre-sharpened iron cantilever, which will be connected to the measurement circuit and act as one of the layers of the system. As a result, conditions will be created that will allow to gradually sink the ferromagnetic material into the dielectric and study the electrical properties of the system depending on the thickness of the dielectric layer. The use of cantilevers with different tip areas will allow investigating the effect of contact area on the electrical properties of the system.